Sobeeh Almukhaizim, Ozgur Sinanoglu. Peak Power Reduction Through Dynamic Partitioning of Scan Chains. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-10, IEEE, 2008. [doi]
Abstract is missing.