B. Alorda, Sebastià A. Bota, Jaume Segura. A Non-Intrusive Built-In Sensor for Transient Current Testing of Digital VLSI Circuits. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 177-182, IEEE Computer Society, 2005. [doi]
Abstract is missing.