Luis Carlos Altamirano, Leopoldo Altamirano Robles, Matías Alvarado. Generation of N-Parametric Appearance-Based Models Through Non-uniform Sampling. In Alberto Sanfeliu, José Francisco Martínez Trinidad, Jesús Ariel Carrasco-Ochoa, editors, Progress in Pattern Recognition, Image Analysis and Applications, 9th Iberoamerican Congress on Pattern Recognition, CIARP 2004, Puebla, Mexico, October 26-29, 2004, Proceedings. Volume 3287 of Lecture Notes in Computer Science, pages 132-139, Springer, 2004. [doi]
Abstract is missing.