Applications of temperature phase measurements to IC testing

Josep Altet, J. M. Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby. Applications of temperature phase measurements to IC testing. Microelectronics Reliability, 44(1):95-103, 2004. [doi]

Abstract

Abstract is missing.