Frank Altmann, Matthias Petzold. Innovative Failure Analysis Techniques for 3-D Packaging Developments. IEEE Design & Test of Computers, 33(3):46-55, 2016. [doi]
@article{AltmannP16,
title = {Innovative Failure Analysis Techniques for 3-D Packaging Developments},
author = {Frank Altmann and Matthias Petzold},
year = {2016},
doi = {10.1109/MDAT.2016.2521828},
url = {http://doi.ieeecomputersociety.org/10.1109/MDAT.2016.2521828},
researchr = {https://researchr.org/publication/AltmannP16},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {33},
number = {3},
pages = {46-55},
}