Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis

Nuno Alves, Y. Shi, N. Imbriglia, Jennifer Dworak, Kundan Nepal, R. Iris Bahar. Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis. In 16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway. pages 211, IEEE Computer Society, 2011. [doi]

Abstract

Abstract is missing.