Gate charge behaviors in N-channel power VDMOSFETs during HEF and PBT stresses

M. Alwan, B. Beydoun, K. Ketata, M. Zoaeter. Gate charge behaviors in N-channel power VDMOSFETs during HEF and PBT stresses. Microelectronics Reliability, 47(9-11):1406-1410, 2007. [doi]

Abstract

Abstract is missing.