Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET

M. Alwan, B. Beydoun, K. Ketata, M. Zoaeter. Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET. Microelectronics Journal, 38(6-7):727-734, 2007. [doi]

Authors

M. Alwan

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B. Beydoun

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K. Ketata

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M. Zoaeter

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