Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET

M. Alwan, B. Beydoun, K. Ketata, M. Zoaeter. Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET. Microelectronics Journal, 38(6-7):727-734, 2007. [doi]

@article{AlwanBKZ07,
  title = {Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET},
  author = {M. Alwan and B. Beydoun and K. Ketata and M. Zoaeter},
  year = {2007},
  doi = {10.1016/j.mejo.2007.04.015},
  url = {http://dx.doi.org/10.1016/j.mejo.2007.04.015},
  researchr = {https://researchr.org/publication/AlwanBKZ07},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Journal},
  volume = {38},
  number = {6-7},
  pages = {727-734},
}