Smart Certification of Mixed Criticality Systems

Peter Amey, Roderick Chapman, Neil White. Smart Certification of Mixed Criticality Systems. In Tullio Vardanega, Andy J. Wellings, editors, Reliable Software Technology - Ada-Europe 2005, 10th Ada-Europe International Conference on Reliable Software Technologies, York, UK, June 20-24, 2005, Proceedings. Volume 3555 of Lecture Notes in Computer Science, pages 144-155, Springer, 2005. [doi]

Abstract

Abstract is missing.