Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, Jörg Henkel. Reliability Challenges with Self-Heating and Aging in FinFET Technology. In Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos, editors, 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019. pages 68-71, IEEE, 2019. [doi]
Abstract is missing.