Rohit Ananthakrishna, Shabbir H. Batterywala. MoM - A Process Variation Aware Statistical Capacitance Extractor. In 19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India. pages 135-140, IEEE Computer Society, 2006. [doi]
Abstract is missing.