Marko S. Andjelkovic, Yuanqing Li, Zoran Stamenkovic, Milos Krstic, Rolf Kraemer. Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells. In Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos, editors, 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019. pages 212-215, IEEE, 2019. [doi]
Abstract is missing.