One-Shot Non-Intrusive Calibration Against Process Variations for Analog/RF Circuits

Martin Andraud, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu. One-Shot Non-Intrusive Calibration Against Process Variations for Analog/RF Circuits. IEEE Trans. on Circuits and Systems, 63-I(11):2022-2035, 2016. [doi]

Abstract

Abstract is missing.