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Statistical aspects of the degradation of LDD nMOSFETs

E. Andries, R. Dreesen, K. Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D Olieslaeger, Jan D Haen. Statistical aspects of the degradation of LDD nMOSFETs. Microelectronics Reliability, 42(9-11):1409-1413, 2002. [doi]

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