Lorena Anghel, Régis Leveugle, Pierre Vanhauwaert. Evaluation of SET and SEU Effects at Multiple Abstraction Levels. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 309-312, IEEE Computer Society, 2005. [doi]
Abstract is missing.