Lorena Anghel, Michael Nicolaidis, Issam Alzaher-Noufal. Self-Checking Circuits versus Realistic Faults in Very Deep Submicron. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 55-66, IEEE Computer Society, 2000. [doi]
Abstract is missing.