Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli. A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. IEEE Transactions on Computers, 72(5):1447-1459, May 2023. [doi]
Abstract is missing.