A Riemannian Framework for Statistical Analysis of Topological Persistence Diagrams

Rushil Anirudh, Vinay Venkataraman, Karthikeyan Natesan Ramamurthy, Pavan K. Turaga. A Riemannian Framework for Statistical Analysis of Topological Persistence Diagrams. In 2016 IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2016, Las Vegas, NV, USA, June 26 - July 1, 2016. pages 1023-1031, IEEE Computer Society, 2016. [doi]

Abstract

Abstract is missing.