Top-Down Deep Appearance Attention for Action Recognition

Rao Muhammad Anwer, Fahad Shahbaz Khan, Joost van de Weijer, Jorma Laaksonen. Top-Down Deep Appearance Attention for Action Recognition. In Puneet Sharma, Filippo Maria Bianchi, editors, Image Analysis - 20th Scandinavian Conference, SCIA 2017, Tromsø, Norway, June 12-14, 2017, Proceedings, Part I. Volume 10269 of Lecture Notes in Computer Science, pages 297-309, Springer, 2017. [doi]

Abstract

Abstract is missing.