Device Aware Diagnosis for Unique Defects in STT-MRAMs

Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui. Device Aware Diagnosis for Unique Defects in STT-MRAMs. In 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract

Abstract is missing.