Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui. Device Aware Diagnosis for Unique Defects in STT-MRAMs. In 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023. pages 1-6, IEEE, 2023. [doi]
@inproceedings{AouichiYFRKMCTH23,
title = {Device Aware Diagnosis for Unique Defects in STT-MRAMs},
author = {Ahmed Aouichi and Sicong Yuan and Moritz Fieback and Siddharth Rao and Woojin Kim and Erik Jan Marinissen and Sebastien Couet and Mottaqiallah Taouil and Said Hamdioui},
year = {2023},
doi = {10.1109/ATS59501.2023.10317952},
url = {https://doi.org/10.1109/ATS59501.2023.10317952},
researchr = {https://researchr.org/publication/AouichiYFRKMCTH23},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023},
publisher = {IEEE},
isbn = {979-8-3503-0310-0},
}