Device Aware Diagnosis for Unique Defects in STT-MRAMs - researchr publication related

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Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui. Device Aware Diagnosis for Unique Defects in STT-MRAMs. In 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023. pages 1-6, IEEE, 2023. [doi]

The following publications are possibly variants of this publication:

Device-Aware Test for Back-Hopping Defects in STT-MRAMsSicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui. date 2023: 1-6 [doi]

Electrical Modeling of STT-MRAM DefectsLizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui. itc 2018: 1-10 [doi]

STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process NodesF. García-Redondo, S. Rao, M. Gupta, Manu Perumkunnil, Y. Xiang, D. Abdi, Simon Van Beek, S. Couet, Marie Garcia Bardon. essderc 2023: 97-100 [doi]

Defect and Fault Modeling Framework for STT-MRAM TestingLizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui. tetc, 9(2):707-723, 2021. [doi]

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