Metrological foundations of emotional valence measurement through an EEG-based system

Andrea Apicella 0001, Pasquale Arpaia, Antonio Esposito 0002, Giovanna Mastrati, Nicola Moccaldi. Metrological foundations of emotional valence measurement through an EEG-based system. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2022, Ottawa, ON, Canada, May 16-19, 2022. pages 1-6, IEEE, 2022. [doi]

Abstract

Abstract is missing.