Karim Arabi, Bozena Kaminska. Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 166-171, IEEE Computer Society, 1997. [doi]
Abstract is missing.