Karim Arabi, Bozena Kaminska, Stephen K. Sunter. Design for testability of integrated operational amplifiers using oscillation-test strategy. In 1996 International Conference on Computer Design (ICCD 96), VLSI in Computers and Processors, October 7-9, 1996, Austin, TX, USA, Proceedings. pages 40-45, IEEE Computer Society, 1996. [doi]
Abstract is missing.