Miho Arai, Isao Shimizu, Haruo Kobayashi, Keita Kurihara, Shu Sasaki, Shohei Shibuya, Kiichi Niitsu, Kazuyoshi Kubo. Finite aperture time effects in sampling circuit. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.