AID: Attesting the Integrity of Deep Neural Networks

Omid Aramoon, Pin-Yu Chen, Gang Qu. AID: Attesting the Integrity of Deep Neural Networks. In 58th ACM/IEEE Design Automation Conference, DAC 2021, San Francisco, CA, USA, December 5-9, 2021. pages 19-24, IEEE, 2021. [doi]

Abstract

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