Tester Correlation Problem in Memory Testers Used in Production Lines

Masaaki Arao, Takao Tadokoro, Hiromi Maruyama, Shinpei Kamata. Tester Correlation Problem in Memory Testers Used in Production Lines. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 464-470, IEEE Computer Society, 1983.

Authors

Masaaki Arao

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Takao Tadokoro

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Hiromi Maruyama

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Shinpei Kamata

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