NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique

Stefano Aresu, Reinhard Pufall, Michael Goroll, Wolfgang Gustin. NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique. Microelectronics Reliability, 48(8-9):1310-1312, 2008. [doi]

Abstract

Abstract is missing.