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Reliability Analysis of H-Tree Random Access Memories Implemented With Built in Current Sensors and Parity Codes for Multiple Bit Upset Correction

Costas Argyrides, Raul Chipana, Fabian Vargas, Dhiraj K. Pradhan. Reliability Analysis of H-Tree Random Access Memories Implemented With Built in Current Sensors and Parity Codes for Multiple Bit Upset Correction. IEEE Transactions on Reliability, 60(3):528-537, 2011. [doi]

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