Lowering the cost of test with a scalable ATE custom processor and timing IC containing 400 high-linearity timing verniers

Brian Arkin. Lowering the cost of test with a scalable ATE custom processor and timing IC containing 400 high-linearity timing verniers. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 6, IEEE, 2005. [doi]

Abstract

Abstract is missing.