A parallel built-in self-diagnostic method for nontraditional faults of embedded memory arrays

Vikram Arora, Wen-Ben Jone, Der-Cheng Huang, Sunil R. Das. A parallel built-in self-diagnostic method for nontraditional faults of embedded memory arrays. IEEE T. Instrumentation and Measurement, 53(4):915-932, 2004. [doi]

Abstract

Abstract is missing.