Multi-label Generic Cuts: Optimal Inference in Multi-label Multi-clique MRF-MAP Problems

Chetan Arora, S. N. Maheshwari. Multi-label Generic Cuts: Optimal Inference in Multi-label Multi-clique MRF-MAP Problems. In 2014 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2014, Columbus, OH, USA, June 23-28, 2014. pages 1346-1353, IEEE, 2014. [doi]

Abstract

Abstract is missing.