Engin Arslan, Serkan Bütün, Yasemin Safak, Habibe Uslu, Ilke Tasçioglu, Semsettin Altindal, Ekmel Özbay. Electrical characterization of MS and MIS structures on AlGaN/AlN/GaN heterostructures. Microelectronics Reliability, 51(2):370-375, 2011. [doi]
Abstract is missing.