B. Arunachalam, Jean-Emmanuel Broquin, Q. Rafhay, D. Roy, A. Kaminski. Simulation Study of the Origin of Ge High Speed Photodetector Degradation. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-4, IEEE, 2021. [doi]
Abstract is missing.