From an analytic NBTI device model to reliability assessment of complex digital circuits

Nasim Pour Aryan, A. Listl, Leonhard Heiß, C. Yilmaz, Georg Georgakos, Doris Schmitt-Landsiedel. From an analytic NBTI device model to reliability assessment of complex digital circuits. In 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014. pages 19-24, IEEE, 2014. [doi]

Abstract

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