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Seeing Behind the Scene: Analysis of Photometric Properties of Occluding Edges by the Reversed Projection Blurring Model

Naoki Asada, Hisanaga Fujiwara, Takashi Matsuyama. Seeing Behind the Scene: Analysis of Photometric Properties of Occluding Edges by the Reversed Projection Blurring Model. IEEE Trans. Pattern Anal. Mach. Intell., 20(2):155-167, 1998. [doi]

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