Kunihiro Asada, Makoto Ikeda, Benjamin Stefan Devlin, Taku Sogabe. Self-Synchrounous Circuits with Completion/Error Detection as a Candidate of Future LSI Resilient for PVT Variations and Aging. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 3, IEEE Computer Society, 2010. [doi]
Abstract is missing.