Krisada Asawarungsaengkul, Sakchai Chitharn. Productivity Improvement on Functional Test of Integrated Circuits Device Under High Temperature Condition. In Jemal H. Abawajy, Mohamed Othman, Rozaida Ghazali, Mustafa Mat Deris, Hairulnizam Mahdin, Tutut Herawan, editors, Proceedings of the Second International Conference on Advanced Data and Information Engineering, DaEng 2015, Bali, Indonesia, April 25-26, 2015. Volume 520 of Lecture Notes in Electrical Engineering, pages 333-341, Springer, 2015. [doi]
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