Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits

A. Asenov, Jie Ding, Dave Reid, Plamen Asenov, Salvatore M. Amoroso, Fikru Adamu-Lema, Louis Gerrer. Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 2449-2452, IEEE, 2015. [doi]

Abstract

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