D. G. Ashen, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi. Testing of programmable logic devices (PLD) with faulty resources. In 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT 97), 20-22 October 1997, Paris, France. pages 76-84, IEEE Computer Society, 1997. [doi]
Abstract is missing.