Yield enhancement by tube redundancy in CNFET-based circuits

Rehman Ashraf, Rajeev K. Nain, Malgorzata Chrzanowska-Jeske, Siva G. Narendra. Yield enhancement by tube redundancy in CNFET-based circuits. In 17th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2010, Athens, Greece, 12-15 December, 2010. pages 442-445, IEEE, 2010. [doi]

Abstract

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