Manuel J. Barragan Asian, Rafaella Fiorelli, Gildas Leger, Adoración Rueda, José L. Huertas. Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 359-364, IEEE Computer Society, 2011. [doi]
Abstract is missing.