Stefan Auer, Xiaoxiang Zhu, Stefan Hinz, Richard Bamler. 3D Analysis of Scattering Effects based on Ray Tracing Techniques. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2009, July 12-17, 2009, University of Cape Town, Cape Town, South Africa, Proceedings. pages 17-20, IEEE, 2009. [doi]
Abstract is missing.