Test-Driven Anonymization for Artificial Intelligence

Cristian Augusto, Jesús Morán, Claudio de la Riva, Javier Tuya. Test-Driven Anonymization for Artificial Intelligence. In IEEE International Conference On Artificial Intelligence Testing, AITest 2019, Newark, CA, USA, April 4-9, 2019. pages 103-110, IEEE, 2019. [doi]

Abstract

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