Relationship between design patterns defects and crosscutting concern scattering degree: an empirical study

Lerina Aversano, Luigi Cerulo, Massimiliano Di Penta. Relationship between design patterns defects and crosscutting concern scattering degree: an empirical study. IEE Proceedings - Software, 3(5):395-409, 2009. [doi]

Abstract

Abstract is missing.