Aspects for Trace Monitoring

Pavel Avgustinov, Eric Bodden, Elnar Hajiyev, Laurie J. Hendren, Ondřej Lhoták, Oege de Moor, Neil Ongkingco, Damien Sereni, Ganesh Sittampalam, Julian Tibble, Mathieu Verbaere. Aspects for Trace Monitoring. In Klaus Havelund, Manuel Núñez, Grigore Rosu, Burkhart Wolff, editors, Formal Approaches to Software Testing and Runtime Verification, First Combined International Workshops, FATES 2006 and RV 2006, Seattle, WA, USA, August 15-16, 2006, Revised Selected Papers. Volume 4262 of Lecture Notes in Computer Science, pages 20-39, Springer, 2006. [doi]


Abstract is missing.