Impact of Simultaneous Switching Noise on the Static behavior of Digital CMOS Circuits

Florence Azaïs, Laurent Larguier, Michel Renovell. Impact of Simultaneous Switching Noise on the Static behavior of Digital CMOS Circuits. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 239-244, IEEE, 2007. [doi]

Abstract

Abstract is missing.