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A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Jérémy Alvarez-Herault, Ken Mackay. A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs. IEEE Trans. VLSI Syst., 22(11):2326-2335, 2014. [doi]

Authors

Joao Azevedo

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Arnaud Virazel

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Alberto Bosio

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Luigi Dilillo

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Patrick Girard

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Aida Todri-Sanial

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Jérémy Alvarez-Herault

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Ken Mackay

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